IXRF, Inc. (USA)

Microanalysis (SEM/EDS — SEM-XRF — SDD)

SEM/EDS | SEM/EDX I SDD

For Scanning Electron Microscopes (SEM), we offer a complete SEM/EDX system: SDD detector, digital signal processor and software. Our all-inclusive, high-end, Windows®-10 based software suite – Iridium Ultra – features a myriad of spectra, mapping, imagin

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SEM-XRF : Integrated e⁻-Beam / X-ray XRF Elemental Analysis

microXRF X-ray sources for Scanning Electron Microscopes (SEM): addition of an polycapillary X-ray tube and Iridium Ultra software will transform your SEM’s quantitative analytical capabilities. Higher peak to background ratios enable greater elemental se

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